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| 概要 |
Several sequential multiple pattern recognition plans are proposed in this paper in view of rank test for Lehmann alternatives. There exist two ways of ranking measurements (i) ranking measurements wi...thin-group, and (ii) reranking measurements at each stage of the sequential process. Moreover, there exist two sequential types (a) sequential observation vectors with p features, and (b) sequential measurements for p features in a cyclic order. Four plans are formulated on the basis of the possible combinations of (i), (ii) and (a), (b). Numerical properties of the plans are concretely illustrated with various values of designing constants by simulations.続きを見る
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