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<図書>
In situ electron and tunneling microscopy of dynamic processes : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.

責任表示 editors, Renu Sharma ... [et al.]
シリーズ Materials Research Society symposium proceedings ; v. 404
データ種別 図書
出版者 Pittsburgh, Pa. : Materials Research Society
出版年 c1996
本文言語 英語
大きさ xi, 226 p. : ill. ; 24 cm
概要 An interdisciplinary exploration of the applicability of different dynamical imaging, diffraction, and spectroscopy methods to various materials and problems. Emphasizing the imaging techniques, the 3... papers provide such perspectives as the HVEM study of high-temperature deformation of ceramic and metallic materials, high-voltage electron microscopy observations of deformity and fracture in multilayered materials, Brownian motion and the coarsening of domain boundaries on (7x7)-Si(111), electromigration-induced void dynamics, and the kinetic study of the passive film on 304 stainless steel using a scanning tunneling microscope. The CiP data shows the title In situ electron tunneling . . . Annotation copyright by Book News, Inc., Portland, OR続きを見る

所蔵情報


筑紫図 067212005001047 501.55/Sh 13 1996

書誌詳細

一般注記 "Papers presented at the first Materials Research Society Symposium on "In Situ Electron and Tunneling Microscopy of Dynamic Processes"--Pref
Includes bibliographical references and index
著者標目 Sharma, Renu
Materials Research Society Symposium on "In Situ Electron and Tunneling Microscopy of Dynamic Processes" (1st : 1995 : Boston, Mass.)
件 名 LCSH:Surfaces (Physics) -- Optical properties -- Congresses  全ての件名で検索
LCSH:Electron microscopy -- Technique -- Congresses  全ての件名で検索
LCSH:Surfaces (Technology) -- Congresses)  全ての件名で検索
LCSH:Image processing -- Congresses  全ての件名で検索
分 類 LCC:QC173.4.S94
DC20:620.1/127
書誌ID 1001166344
ISBN 155899307X
NCID BA28558681
巻冊次 ISBN:155899307X
登録日 2009.09.17
更新日 2009.09.17

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