Export Mendeley
＜Doctoral Thesis＞
Microstructural analysis of Fe-based superconducting thin films toward the grain boundary engineering for better critical current properties
| Creator | |
|---|---|
| Examiner | |
| Language | |
| Academic Year Conferred | |
| Conferring University | |
| Degree | |
| Degree Type | |
| Publication Type | |
| Access Rights |
Hide fulltext details.
| File | FileType | Size | Views | Description |
|---|---|---|---|---|
tj1234
|
48.5 MB | 334 | 本文 | |
|
tj1234_abstract
|
292 KB | 113 | 要旨 | |
|
tj1234_review
|
63.9 KB | 95 | 審査結果要旨 |
Details
| Record ID | |
|---|---|
| Peer-Reviewed | |
| Report Number | |
| Number of Diploma | |
| Granted Date | |
| Date Accepted | |
| Faculty | |
| Created Date | 2022.11.02 |
| Modified Date | 2023.05.19 |