Measurement of muon-induced SEU cross sections and muonic X-rays for 65-nm SRAMs - Collections

＜Master Thesis＞
Measurement of muon-induced SEU cross sections and muonic X-rays for 65-nm SRAMs

	Measurement of muon-induced SEU cross sections and muonic X-rays for 65-nm SRAMs
Creator	Creator Name 馬原, 巧 Mahara, Takumi マハラ, タクミ Affiliation Affiliation Name 九州大学総合理工学府先端エネルギー理工学専攻 Advanced Energy Engineering Science, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University
Language	English
Academic Year Conferred	2019
Conferring University	九州大学
Conferring University	Kyushu University
Degree	MASTER
Degree Type	Master's Degree
Publication Type	Version of Record
Access Rights	open access

File	FileType	Size	Views	Description
4067225_fulltext_1	pdf	4.85 MB	517	本文

Record ID	4067225
Keywords	先端エネルギー理工学専攻
	Advanced Energy Engineering Science
	総合理工学府（修士）
Granted Date	2020-03-23
Faculty	総理工
Notes	修士（工学）
Funding Information	Funder Name 日本学術振興会 Japan Society for the Promotion of Science (JSPS) Award Number 16H03906 Award Title 半導体デバイスのミューオン誘起ソフトエラー率評価のための技術基盤構築 Development of technical platform for estimation of muon-induced soft error rates in semiconductor devices
Funding Information	Funder Name JST産学共創プラットフォーム同研究推進プログラム（OPERA） Award Number JPMJOP1721 Award Title 安全・安心スマートな長寿社会実現のため高度な量子アプリケーション技術の創出
Created Date	2020.09.04
Modified Date	2020.09.29