<会議発表論文>
Row/Column Redundancy to Reduce SRAM Leakage in Presence of Random Within-Die Delay Variation

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概要 Traditionally, spare rows/columns have been used in two ways: either to replace too leaky cells to reduce leakage, or to substitute faulty cells to improve yield. In contrast, we first choose a higher... threshold voltage (Vth) and/or gate-oxide thickness (Tox) for SRAM transistors at design time to reduce leakage, and then substitute the resulting too slow cells by spare rows/columns. We show that due to within-die delay variation of SRAM cells only a few cells violate target timing at higher Vth or Tox; we carefully choose the Vth and Tox values such that the original memory timing-yield remains intact for a negligible extra delay. On a commercial 90nm process assuming 3% variation in SRAM cell delay, we obtained 47% leakage reduction by adding only 5 redundant columns at negligible area, dynamic power and delay costs.続きを見る

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登録日 2009.04.22
更新日 2020.10.26

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