Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings - 九大コレクション

＜電子ブック＞
Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings

責任表示	Dit-Yan Yeung ... [et al.] (eds.)
著者	International Workshop on Structural and Syntactic Pattern Recognition
	Yeung, Dit-Yan,
	International Association for Pattern Recognition
	International Workshop on Statistical Techniques in Pattern Recognition
本文言語	English (英語)
出版者	Springer
出版年	2006-
出版地	Berlin, Germany
出版地	New York
関連情報	シリーズ Lecture notes in computer science ; 4109
冊子版へのリンク	http://hdl.handle.net/2324/1001299103
本文を見る	Full text available from Springer Computer Science eBooks 2006 English/International Full text available from SpringerLINK Lecture Notes in Computer Science (2015)

レコードID	3649772
刊行頻度	年刊
主題	TK7882.P3
	006.4
	Pattern recognition systems
SSID	ssj0000320244
LCCN	2006930416
eISBN	9783540372363[3540372369](pbk.)
注記	SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences
登録日	2020.06.27
更新日	2020.06.28