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Statistical Quality Technologies : Theory and Practice

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概要 This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of th...e essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today's fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.続きを見る
目次 Part I. Statistical Process Control
Chapter 1. Some Recent Studies in Statistical Process Control
Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications
Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control
Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling
Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation
Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution
Part II. Acceptance Sampling Plans
Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions
Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes
Chapter 9. Economical Sampling Plans with Warranty
Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test
Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests
Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family
Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors
Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring
Chapter 15. Robust Design in the Case of Data Contamination and Model Departure
Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing.
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本文を見る Full text available from Springer Mathematics and Statistics eBooks 2019 English/International

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登録日 2020.06.27
更新日 2020.06.28