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＜Doctoral Thesis＞
Study on defect characterization of Ge gate stacks using deep-level transient spectroscopy
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tj1136
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2.65 MB | 533 | 本文 | |
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tj1136_abstract
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104 KB | 212 | 要旨 | |
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tj1136_review
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107 KB | 241 | 審査結果要旨 |
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| Created Date | 2020.11.13 |
| Modified Date | 2021.01.29 |