Study of low-energy muon-induced single event upsets in 65-nm UTBB-SOI static random access memories - Collections

＜Master Thesis＞
Study of low-energy muon-induced single event upsets in 65-nm UTBB-SOI static random access memories

	Study of low-energy muon-induced single event upsets in 65-nm UTBB-SOI static random access memories
Creator	Creator Name 真鍋, 征也 Manabe, Seiya マナベ, セイヤ Affiliation Affiliation Name 九州大学総合理工学府先端エネルギー理工学専攻 Advanced Energy Engineering Science, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University
Language	English
Academic Year Conferred	2017
Conferring University	九州大学
Conferring University	Kyushu University
Degree	MASTER
Degree Type	Master's Degree
Access Rights	metadata only access

Record ID	1938045
Rights	著者の意向により本文ファイル非公開
Rights	Public access to the fulltext file is restricted by author reason
Granted Date	2018-03-20
Faculty	総理工
Notes	修士（工学）
Created Date	2018.08.22
Modified Date	2018.08.22