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We report the growth of multilayer boron films on Mo(112) surface by e-beam deposition. Subsequent annealing after deposition shows ordered structure of c(2×2) for 1st layer, which is consistent with ...an earlier study. Additional deposition of boron atoms revealed no ordered structure for 2nd and 3rd layer as evident from scanning tunneling microscopy and low energy electron diffraction. Scanning tunneling spectroscopy measurements demonstrate the semiconducting nature of the 2nd and 3rd layer with a band gap of 1.2 and 1.4 eV, respectively. On the other hand, 1st layer is metallic. These results show prospects for the practical applications of boron based nanomaterials in the future.続きを見る
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