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＜紀要論文＞
A SIMULATION OF SECTION TOPOGRAPHS USING SYNCHROTRON RADIATION
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| 概要 | A section topography using synchrotron radiation is proposed and incidental problems are discussed with the aid of a computer simulation. The effect of higher order diffractions is examined for (111) ...and (110) systematic reflections, and it is shown that only a single reflection contributes to a topograph if we use an adapted wave length. The effect of a broad spectrum of the incident beam is also examined. Contribution to the images due to wave length extended up to ±5x10^-4 nm from a given wave length of 0.1nm is inquired, and no trouble some effect is found.続きを見る |
| 目次 | 1. Introduction 2. Section topography using synchrotron radiation 3. Computer simulation 4. Examinations with simulated topographs 5. Conclusion |
本文ファイル
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027086_p159
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3.88 MB | 30 |
詳細
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| 登録日 | 2023.03.22 |
| 更新日 | 2024.10.22 |