| 作成者 |
|
|
|
| 本文言語 |
|
| 出版者 |
|
|
|
| 発行日 |
|
| 収録物名 |
|
| 巻 |
|
| 開始ページ |
|
| 終了ページ |
|
| 出版タイプ |
|
| アクセス権 |
|
| 関連DOI |
|
|
|
| 関連URI |
|
|
|
| 関連情報 |
|
|
|
| 概要 |
Low-energy electron diffraction (LEED) have been used to determine the p (3√2×√2)R45°structure formed at 300K by adsorption of Sn atoms on Cu(001). It is confirmed that the same model suggested by pre...vious studies of surface x-ray diffraction, density functional calculations and LEED analysis is correct. It contains missing-rows along the [100] direction. Optimum parameters of the p (3√2×√2)R45°structure reveal that the substitutional Sn atoms laterally displaced by 0.30±0.05Åaway from ideal fourfold-hollow sites. Distance between the nearest-neighbor substitutional Sn atoms is 3.02±0.05 Å, suggesting the formation of an Sn dimer. The stabilization mechanism of the p(3√2×√2)R45°structure is discussed.続きを見る
|
Mendeley出力
