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<図書>
Nanocharacterisation

責任表示 edited by Angus I Kirkland, John L Hutchison
シリーズ RSC nanoscience & nanotechnology
データ種別 図書
出版情報 Cambridge : Royal Society of Chemistry , c2007
本文言語 英語
大きさ xiii, 304 p. : ill. (some col.) ; 24 cm
概要 Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in ...his book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field, this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state-of-the-art characterisation methods including: Transmission Electron Microscopy, Electron Tomography, Tunnelling Microscopy, Electron Holography, Electron Energy Loss Spectroscopy. This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology. Book jacket.続きを見る

所蔵情報



[伊]超顕微解析 549.97/Ki 54 2010
037212011000515

書誌詳細

一般注記 Includes bibliographical references and index
著者標目 Kirkland, Angus I
Hutchison, John L
件 名 LCSH:Nanotechnology
LCSH:Electron microscopy
分 類 LCC:T174.7
DC22:620.5
書誌ID 1001461348
ISBN 9780854042418
NCID BB07453900
巻冊次 ISBN:9780854042418
NBN GBA733266
登録日 2011.12.01
更新日 2011.12.01

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