Mendeley出力
＜図書＞
Arithmetic built-in self-test for embedded systems
| 責任表示 | Janusz Rajski, Jerzy Tyszer |
|---|---|
| データ種別 | 図書 |
| 出版情報 | Upper Saddle River, NJ : Prentice Hall PTR , c1998 |
| 本文言語 | 英語 |
| 大きさ | xii, 268 p. : ill. ; 24 cm |
| 概要 | This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.This book explains what arithmetic built-in self-test (...IST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.Hardware/embedded system designers, test engineers, researchers working on IC/core testing, and graduate students. 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
|
|
|
理系図1F 開架 | 007.6/R 12 | 1998 |
|
026211999000175 |
|
書誌詳細
| 一般注記 | Includes bibliographical references (p. [249]-263) and index |
|---|---|
| 著者標目 | *Rajski, Janusz Tyszer, Jerzy |
| 件 名 | LCSH:Embedded computer systems -- Testing
全ての件名で検索
LCSH:Computer firmware |
| 分 類 | LCC:TK7895.E42 DC21:621.39/5/0287 |
| 書誌ID | 1001369873 |
| ISBN | 0137564384 |
| NCID | BA46484135 |
| 巻冊次 | ISBN:0137564384 |
| 登録日 | 2009.09.18 |
| 更新日 | 2009.09.18 |