Mendeley出力
＜図書＞
Testing and testable design of high-density random-access memories
| 責任表示 | by Pinaki Mazumder and Kanad Chakraborty |
|---|---|
| シリーズ | Frontiers in electronic testing |
| データ種別 | 図書 |
| 出版情報 | Boston, Mass : Kluwer Academic , 1996 |
| 大きさ | 386 p. ; 24 cm |
| 概要 | An integrated approach to testing and testable design techniques for Random Access Memories (RAMs) focusing on techniques being used to increase memory and lower the cost of test equipment. The volu...e introduces the technological advances made in the past two decades of semiconductor memory design, describing electrical testing performed at the interface of memory during post-manufacture inspection and field use, the functional fault modeling and testing of memories, fault models and test algorithms for electrical faults, and the concepts of built-in self-test (BIST) and design for testability (DFT). The appendices include a glossary of terminology and commercial DRAM and SRAM data. Annotation copyrighted by Book News, Inc., Portland, OR続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
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シ情 情報知能[AB] | 549.8/Ma 99 | 1996 |
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026211997001760 |
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書誌詳細
| 一般注記 | Includes bibliographical references and index |
|---|---|
| 著者標目 | *Mazumder, Pinaki Chakraborty, Kanad |
| 件 名 | LCSH:Random access memory -- Testing 全ての件名で検索 |
| 分 類 | LCC:TK7895.M4 DC20:621.39/732 |
| 書誌ID | 1001356676 |
| ISBN | 0792397827 |
| NCID | BA29581055 |
| 巻冊次 | ISBN:0792397827 |
| 登録日 | 2009.09.18 |
| 更新日 | 2009.09.18 |