Mendeley出力
＜図書＞
Nanoscale calibration standards and methods : dimensional and related measurements in the micro- and nanometer range
| 責任表示 | edited by Günter Wilkening, Ludger Koenders |
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| データ種別 | 図書 |
| 出版情報 | Weinheim : Wiley-VCH , c2005 |
| 本文言語 | 英語 |
| 大きさ | xxii, 519 p. : ill. ; 25 cm |
| 概要 | In these papers taken from the Nanoscale 2004 seminar in March 2004, participants describe their work in qualitative measurement, instrumentation, calibration and applications. The 38 individual topic... include metrology of scanning probe microscopes, DSP-based scanning probe microscopes, sheer-force tunneling microscopes, SPM calibration, traceability, 3D calibration, tolerance systems, calibration standards, lateral resolution, tip shape and calibration, optical methods of calibration, lateral structures, surface applications, and material properties. Annotation ©2005 Book News, Inc., Portland, OR (booknews.com) 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
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筑紫図 1D 450-599 | 532.8/W 73 | 2005 |
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067212006001036 |
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書誌詳細
| 一般注記 | Conference proceedings Includes bibliographical references and index |
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| 著者標目 | Wilkening, Günter Koenders, Ludger |
| 件 名 | LCSH:Nanostructured materials -- Measurement -- Congresses
全ての件名で検索
LCSH:Microstructure -- Measurement -- Congresses 全ての件名で検索 LCSH:Scientific apparatus and instruments -- Calibration -- Congresses 全ての件名で検索 LCSH:Stereology -- Congresses 全ての件名で検索 |
| 分 類 | LCC:QC176.8.N35 DC22:620.50287 DC22:681.20287 |
| 書誌ID | 1001326703 |
| ISBN | 9783527405022 |
| NCID | BA79994126 |
| 巻冊次 | ISBN:9783527405022 ; XISBN:352740502X |
| 登録日 | 2009.09.18 |
| 更新日 | 2017.10.03 |