Mendeley出力
＜図書＞
Fault diagnosis of analog integrated circuits
| 責任表示 | by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha |
|---|---|
| シリーズ | Frontiers in electronic testing ; 30 |
| データ種別 | 図書 |
| 出版情報 | Dordrecht : Springer , c2005 |
| 本文言語 | 英語 |
| 大きさ | ix, 182 p. : ill. ; 25 cm |
| 概要 | System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixe... signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.続きを見る |
| 電子版へのリンク | https://hdl.handle.net/2324/6949028 |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
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理系図2F 開架 | 547.9/Ka 11 | 2005 |
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026212006000123 |
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書誌詳細
| 一般注記 | Includes bibliographical references and index |
|---|---|
| 著者標目 | *Kabisatpathy, Prithviraj Barua, Alok Sinha, Satyabroto |
| 件 名 | LCSH:Linear integrated circuits LCSH:Linear integrated circuits -- Testing 全ての件名で検索 |
| 分 類 | LCC:TK7874.654 DC22:621.3815 |
| 書誌ID | 1001300860 |
| ISBN | 038725742X |
| NCID | BA77072609 |
| 巻冊次 | ISBN:038725742X |
| 登録日 | 2009.09.18 |
| 更新日 | 2017.02.18 |