Mendeley出力
＜図書＞
Hardware and software verification and testing : First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005. revised selected papers
| 責任表示 | Shmuel Ur, Eyal Bin, Yaron Wolfsthal (eds.) |
|---|---|
| シリーズ | Lecture notes in computer science ; 3875 |
| データ種別 | 図書 |
| 出版情報 | Berlin : Springer Berlin , c2006 |
| 本文言語 | 英語 |
| 大きさ | x, 264 p. : ill. ; 24 cm |
| 概要 | This book constitutes the refereed post-proceedings of the First International Conference on Hardware Verification, Software Testing, and PADTAD held in November 2005. The conference combines the six...h IBM Verification Workshop, the fourth IBM Software Testing Workshop, and the third PADTAD (Parallel and Distributed Systems: Testing and Debugging) Workshop. The 14 revised full papers presented together with three invited contributions were carefully reviewed and selected from 31 submissions. The papers address all current issues in hardware/software verification, software testing, and testing of parallel and concurrent applications. 続きを見る |
| 電子版へのリンク | https://hdl.handle.net/2324/6947837 |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
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理系図 自動書庫 | 408/L 49 | 2006 |
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061212006000165 |
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書誌詳細
| 著者標目 | International Haifa Verification Conference (2005 : Haifa, Israel) Ur, Shmuel Bin, Eyal Wolfsthal, Yaron |
|---|---|
| 分 類 | SG:004 |
| 書誌ID | 1001292602 |
| ISBN | 3540326049 |
| NCID | BA7674428X |
| 巻冊次 | ISBN:3540326049 ; XISBN:9783540326045 |
| 登録日 | 2009.09.18 |
| 更新日 | 2017.02.18 |