<図書>
Scan statistics : Methods and applications
責任表示 | Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein, editors |
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シリーズ | Statistics for industry and technology |
データ種別 | 図書 |
出版情報 | Boston : Birkhäuser , c2009 |
本文言語 | 英語 |
大きさ | xxviii, 394 p. ; 27 cm |
概要 | Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bio...nformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. 続きを見る |
電子版へのリンク | https://hdl.handle.net/2324/6996330 |
所蔵情報
状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
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理系図3F 数理独自 | P 009/SCAN/1 | 2009 |
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023212009002635 |
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書誌詳細
一般注記 | Includes bibliographical references and index |
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著者標目 | Glaz, Joseph Pozdnyakov, Vladimir Wallenstein, Sylvan |
件 名 | LCSH:Order statistics |
分 類 | LCC:QA278.7 DC21:519.5 |
書誌ID | 1001223730 |
ISBN | 9780817647483 |
NCID | BA90443137 |
巻冊次 | ISBN:9780817647483 |
登録日 | 2009.09.18 |
更新日 | 2017.02.18 |