<図書>
X-ray spectrometry in electron beam instruments
責任表示 | edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury |
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データ種別 | 図書 |
出版情報 | New York : Plenum Press , c1995 |
本文言語 | 英語 |
大きさ | xviii, 372 p. : ill. ; 26 cm |
概要 | A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spect...ometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation copyright by Book News, Inc., Portland, OR続きを見る |
所蔵情報
状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
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理系図 自動書庫 | 433.5/W | 1995 |
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068252195010967 |
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[伊]超顕微解析 | 173 | 1995 |
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025211996001464 |
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書誌詳細
一般注記 | Includes bibliographical references and index |
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著者標目 | Williams, David B. (David Bernard), 1949- Goldstein, Joseph, 1939- Newbury, Dale E. |
件 名 | LCSH:Electron beams -- Instruments
全ての件名で検索
LCSH:X-ray spectroscopy LCSH:Electron probe microanalysis |
分 類 | LCC:QC793.5.E622 DC20:543/.08586 |
書誌ID | 1001164411 |
ISBN | 0306448580 |
NCID | BA27444133 |
巻冊次 | ISBN:0306448580 |
登録日 | 2009.09.17 |
更新日 | 2009.09.17 |