Mendeley出力
＜図書＞
Transmission electron microscopy of minerals and rocks
| 責任表示 | Alex C. McLaren |
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| シリーズ | Cambridge topics in mineral physics and chemistry ; 2 |
| データ種別 | 図書 |
| 出版情報 | Cambridge ; New York : Cambridge University Press , c1991 |
| 本文言語 | 英語 |
| 大きさ | x, 387 p. : ill. ; 24 cm |
| 概要 | Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of c...ystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Rocks and Minerals is an introduction to the principles of the technique and is the only book to date on the subject written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. The examples cover a wide range of rock-forming minerals from crustal rocks to those in the lower mantle, and also take into account the role of defects in important mineralogical and geological processes. 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
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理系図1F 開架 | 459.1/Ma 21 | 1991 |
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031212008000592 |
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書誌詳細
| 一般注記 | Bibliography: p. 365-381 Includes index |
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| 著者標目 | *McLaren, Alex C. |
| 件 名 | LCSH:Mineralogy, Determinative LCSH:Transmission electron microscopes |
| 分 類 | LCC:QE369.M5 DC20:549/.12 |
| 書誌ID | 1001141274 |
| ISBN | 0521350980 |
| NCID | BA12546504 |
| 巻冊次 | ISBN:0521350980 |
| 登録日 | 2009.09.17 |
| 更新日 | 2009.09.17 |