Mendeley出力
＜図書＞
Fault diagnosis of digital circuits
| 責任表示 | V.N. Yarmolik |
|---|---|
| データ種別 | 図書 |
| 出版情報 | Chichester ; New York : Wiley , c1990 |
| 本文言語 | 英語 |
| 大きさ | viii, 198 p. : ill. ; 25 cm |
| 概要 | The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniq...es available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits. 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
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筑紫図 1C 450-599 | 549.3/Y 59 | 1990 |
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067232006005328 |
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書誌詳細
| 別書名 | 原タイトル:Kontrolʹ i diagnostika t︠s︡ifrovykh uzlov ĖVM |
|---|---|
| 一般注記 | Translation of: Kontrolʹ i diagnostika t︠s︡ifrovykh uzlov ĖVM Bibliography: p. [191]-196 Includes index |
| 著者標目 | *I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich) |
| 件 名 | LCSH:Digital integrated circuits -- Testing 全ての件名で検索 |
| 分 類 | LCC:TK7874 DC20:621.381/5 |
| 書誌ID | 1001139505 |
| ISBN | 0471926809 |
| NCID | BA11018624 |
| 巻冊次 | ISBN:0471926809 ; PRICE:$55.00 |
| 登録日 | 2009.09.17 |
| 更新日 | 2009.09.17 |