| 1 |
26
Testing static random access memories : defects, fault models, and test patterns / by Said Hamdioui
Boston : Kluwer Academic , c2004
|
| 2 |
IDDQ testing of VLSI circuits / edited by Ravi K. Gulati and Charles F. Hawkins
Boston : Kluwer Academic Publishers , c1993
|
| 3 |
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal
Boston, MA : Kluwer Academic , c2000
|
| 4 |
35
The core test wrapper handbook : rationale and application of IEEE Std. 1500 / by Francisco da Silva, Teresa McLaurin, Tom Waayers
New York : Springer , c2006
|
| 5 |
v. 9
Reasoning in Boolean networks : logic synthesis and verification using testing techniques / by Wolfgang Kunz and Dominik Stoffel
Boston : Kluwer Academic , c1997
|
| 6 |
High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams
Boston ; London : Kluwer Academic , c2003
|
| 7 |
30
Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha
Dordrecht : Springer , c2005
|
| 8 |
33
Digital timing measurements : from scopes and probes to timing and jitter / Wolfgang Maichen
Dordrecht : Springer , c2006
|
| 9 |
22
Power-constrained testing of VLSI circuits / by Nicola Nicolici and Bashir M. Al-Hashimi
Boston ; London : Kluwer Academic , c2003
|
| 10 |
A designer's guide to built-in self-test / Charles E. Stroud
Boston, MA : Kluwer Academic , c2002
|
| 11 |
21
SOC (System-on-a-Chip) testing for plug and play test automation / edited by Krishnendu Chakrabarty
Boston, [Mass.] ; London : Kluwer Academic , c2002
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