Characterisation of radiation damage by transmission electron microscopy

＜図書＞
Characterisation of radiation damage by transmission electron microscopy

責任表示	M.L. Jenkins, M.A. Kirk
シリーズ	Microscopy in materials science series
データ種別	図書
出版情報	Bristol ; Philadelphia : Institute of Physics Pub. , c2001
本文言語	英語
大きさ	x, 224 p. : ill. ; 25 cm
概要	Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by ...ast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. 続きを見る

状態	巻次	所蔵場所	請求記号	刷年	文庫名称	資料番号	コメント	予約・取寄	複写申込	自動書庫
		筑紫図 1D 450-599	501.55/J 36	2001		062212002000275		予約・取寄			予約・取寄
		筑紫図 1D 450-599	501.55/J 36/a	2001		160032024000177		予約・取寄			予約・取寄

一般注記	Includes bibliographical references and index
著者標目	*Jenkins, M. L., 1949- Kirk, M. A., 1942-
件　名	LCSH:Materials -- Effect of radiation on 全ての件名で検索 LCSH:Materials -- Microscopy 全ての件名で検索 LCSH:Transmission electron microscopy
分　類	LCC:TA418.6 DC21:620.1/1228
書誌ID	1001010868
ISBN	075030748X
NCID	BA53960344
巻冊次	ISBN:075030748X
登録日	2009.09.16
更新日	2009.09.16