Mendeley出力
＜図書＞
Surface analysis of polymers by XPS and static SIMS
| 責任表示 | D. Briggs |
|---|---|
| シリーズ | Cambridge solid state science series |
| データ種別 | 図書 |
| 出版情報 | New York : Cambridge University Press , 1998 |
| 本文言語 | 英語 |
| 大きさ | xiv, 198 p. : ill. ; 26cm |
| 概要 | This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus o... the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
|
|
hc | 筑紫図 1C 400-449 | 431.86/B 73 | 1998 |
|
067212000005597 |
|
書誌詳細
| 一般注記 | Includes bibliographical references |
|---|---|
| 著者標目 | *Briggs, D. |
| 件 名 | LCSH:Polymers -- Surfaces -- Analysis
全ての件名で検索
LCSH:X-ray spectroscopy LCSH:Secondary ion mass spectrometry |
| 分 類 | LCC:QD381.9.S97 DC21:620.1/92 |
| 書誌ID | 1000962072 |
| ISBN | 0521352223 |
| NCID | BA36769081 |
| 巻冊次 | hc ; ISBN:0521352223 |
| 登録日 | 2009.09.16 |
| 更新日 | 2024.05.20 |