Electron backscatter diffraction in materials science

＜図書＞
Electron backscatter diffraction in materials science

責任表示	edited by Adam J. Schwartz, Mukul Kumar and Brent L. Adams
データ種別	図書
出版情報	New York : Kluwer Academic/Plenum , c2000
本文言語	英語
大きさ	xvi, 339 p. : ill. (some col.) ; 26 cm
概要	Provides the fundamental basis for electron backscatter diffraction (EBSD), briefly covers the crystallography required for application, discusses the latest hardware and software available, and descr...bes specific applications of EBSD. Chapter topics include representations of texture in orientation space, automated EBSD, phase identification using EBSD, and three-dimensional orientation imaging. Other topics are buying a system, strategies for analyzing EBSD datasets, use of EBSD data in mesoscale numerical analyses, characterization of deformed microstructures, and continuous recrystallization and grain boundaries in a superplastic aluminum alloy. Schwartz is affiliated with Lawrence Livermore National Laboratory. Annotation copyrighted by Book News, Inc., Portland, OR続きを見る

一般注記	Includes bibliographical references and index
著者標目	Schwartz, Adam J. Kumar, Mukul Adams, B. L. (Brent L.)
件　名	LCSH:Materials -- Microscopy 全ての件名で検索 LCSH:Scanning electron microscopy LCSH:Crystallography
分　類	LCC:TA417.23 DC21:620.1/1299
書誌ID	1000960673
ISBN	030646487X
NCID	BA50121317
巻冊次	ISBN:030646487X
登録日	2009.09.16
更新日	2009.09.18