Mendeley出力
＜図書＞
Scanning electron microscopy and X-ray microanalysis
| 責任表示 | Joseph I. Goldstein, Dale E. Newbury ... [et al.] |
|---|---|
| データ種別 | 図書 |
| 版 | 3rd ed |
| 出版者 | New York : Springer Science |
| 出版年 | c2003 |
| 本文言語 | 英語 |
| 大きさ | xix, 690 p. : ill.(some col.) ; 26 cm. + 1 computer laser optical disc |
| 概要 | The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray ...pectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com) 続きを見る |
所蔵情報
| 状態 | 巻次 | 所蔵場所 | 請求記号 | 刷年 | 文庫名称 | 資料番号 | コメント | 予約・取寄 | 複写申込 | 自動書庫 |
|---|---|---|---|---|---|---|---|---|---|---|
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筑紫図 1C 洋500-599 | 549.97/G 61 | 2003 |
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067212007000861 |
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書誌詳細
| 一般注記 | Include subject index |
|---|---|
| 著者標目 | Goldstein, Joseph, 1939- Newbury, Dale E. |
| 件 名 | LCSH:Scanning electron microscopy LCSH:X-ray microanalysis |
| 書誌ID | 1001333126 |
| ISBN | 9780306472923 |
| NCID | BA84769592 |
| 巻冊次 | ISBN:9780306472923 ; XISBN:0306472929 |
| 登録日 | 2009.09.18 |
| 更新日 | 2009.09.18 |