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<図書>
Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7-10 April 1997

責任表示 by A.G. Cullis and J.L. Hutchison
シリーズ Institute of Physics conference series ; no. 157
データ種別 図書
出版者 Philadelphia : Institute of Physics
出版年 1997
本文言語 英語
大きさ xvi, 709 p. : ill. ; 24 cm
概要 This tenth volume in the series provides an overview of recent developments & current research activity including both invited review & summary research papers. Particular importance is attached at th...s meeting to papers addressing the centenary of the discovery of the electron. "MSM" has become the premier forum for dissemination of research results in this well established field, which is of continuing importance for the analysis of both reliable substrate materials, & as-grown devices in the whole range of semiconducting materials. It covers developments in analysis techniques across the whole range of microscopies. Also includes specimen preparation techniques. 続きを見る

所蔵情報


筑紫図 1B 会議録 420.8/I 57/157 1997
062212002000061

[伊]超顕微解析 188 1997
025211997004587

書誌詳細

一般注記 Includes bibliographical references and index
著者標目 *Royal Microscopical Society (Great Britain) Conference (1997 : Oxford University)
Cullis, A. G.
Hutchison, J. L.
件 名 LCSH:Semiconductors -- Surfaces -- Congresses  全ての件名で検索
LCSH:Materials -- Microscopy -- Congresses  全ての件名で検索
LCSH:Epitaxy -- Congresses  全ての件名で検索
LCSH:High resolution microscopy -- Congresses  全ての件名で検索
分 類 LCC:QC611.6.S9
DC21:537.6/22
書誌ID 1001013932
ISBN 0750304642
NCID BA34381554
巻冊次 ISBN:0750304642
登録日 2009.09.16
更新日 2009.09.16

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