Microscopy of semiconducting materials, 1987 : proceedings of the Institute of Physics Conference held at Oxford University, 6-8 April 1987

＜図書＞
Microscopy of semiconducting materials, 1987 : proceedings of the Institute of Physics Conference held at Oxford University, 6-8 April 1987

責任表示	edited by A.G. Cullis and P.D. Augustus
シリーズ	Institute of Physics conference series ; no. 87
データ種別	図書
出版者	Bristol, England ; Philadelphia : Institute of Physics
出版年	c1987
本文言語	英語
大きさ	802 p. : ill. ; 24 cm
概要	Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering ...echniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. 続きを見る

一般注記	"The fifth Oxford Conference on the Microscopy of Semiconducting Materials" -- Cover
著者標目	Cullis, A. G. Augustus, P. D. Royal Microscopical Society (Great Britain) Institute of Physics (Great Britain)
件　名	LCSH:Semiconductors -- Congresses 全ての件名で検索 LCSH:Electron microscopy -- Congresses 全ての件名で検索
分　類	LCC:QC610.9 DC19:537.6/22
書誌ID	1000914094
ISBN	0854981780
NCID	BA01568640
巻冊次	ISBN:0854981780 ; PRICE:£50.00
登録日	2009.09.16
更新日	2009.09.17