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<図書>
X-ray spectroscopy : an introduction

責任表示 B.K. Agarwal
シリーズ Springer series in optical sciences ; v. 15
データ種別 図書
出版者 Berlin ; New York : Springer-Verlag
出版年 1979
本文言語 英語
大きさ xiii, 418 p. : ill. ; 24 cm
概要 X-ray spectroscopy has emerged as a powerful tool in research and in industrial laboratories. It is used in the study of metals, semiconductors, amorphous solids, liquids and gases. This comprehensiv... presentation develops the subject from its basic principles and relates the theory to experimental observations. The new edition includes topics that have recently become important, for example, the X-ray laser, appearance potential spectroscopy, synchrotron radiation and EXAFS of high-Tc superconducting materials. A thorough introduction, up to research level, isprovided to EXAFS, which has seen rapid development in the past few years. This textbook conveniently presents the principles, applications and current techniques of X-ray spectroscopy, which makes it ideal for graduate students beginning research involving x-ray spectroscopy. 続きを見る
電子版へのリンク

所蔵情報

: gw 【故障中】理系図 自動書庫 427.55/A 19/1 1979
058211981501342
: gw 【故障中】理系図 自動書庫 425.08/Sp 8/(15)

068222480044683

書誌詳細

一般注記 Includes bibliographical references and indexes
著者標目 *Agarwal, B. K. (Bipin Kumar), 1931-
件 名 LCSH:X-ray spectroscopy
分 類 NDLC:MC231
LCC:QC482.S6
DC:537.5/352
書誌ID 1000516128
ISBN 0387092684
NCID BA02946131
巻冊次 : us ; ISBN:0387092684
: gw ; ISBN:3540092684
登録日 2009.09.14
更新日 2009.09.14

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