X-ray optics and microanalysis 1992 : proceedings of the thirteenth International Congress, UMIST, Manchester, UK, 31 August-4 September 1992

X-ray optics and microanalysis 1992 : proceedings of the thirteenth International Congress, UMIST, Manchester, UK, 31 August-4 September 1992

フォーマット:
図書
責任表示:
edited by P.B. Kenway ... [et al.]
本文言語:
英語
説明:
xxiii, 652 p.; 24 cm
出版情報:
Bristol [England] ; Philadelphia, United Kingdom. c1993. Institute of Physics
シリーズ:
Institute of Physics conference series; no. 130
本文を見る
所蔵情報
Loading availability information

類似資料:

2
Electron microscopy and analysis, 1995 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Birmingham, &hellip by Institute of Physics Electron Microscopy and Analysis Group Conference; Cherns, David; Institute of Physics; Institute …
8
Electron microscopy of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A. by Symposium on Electron Microscopy of Materials; Krakow, William; Smith, David A.; Hobbs, Linn W.; Materials Research …
3
Electron microscopy and analysis, 1993 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Liverpool, &hellip by Institute of Physics Electron Microscopy and Analysis Group Conference; Craven, A. J.; Institute of Physics; Institute …
4
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A. by Krakow, William; Ponce, Fernando A.; Smith, David J., 1948-; Symposium on High Resolution Microscopy of Materials; …
6
Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991 by Cullis, A. G.; Long, N. J.; Institute of Physics; Royal Microscopical Society; Materials Research Society
12
Proceedings of the Sixth International Conference on X-ray optics and microanalysis by International Congress on X-ray Optics and Microanalysis; Shinoda, G.; 高良, 和武; 市ノ川, 竹男
2.
Electron microscopy and analysis, 1995 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Birmingham, &hellip by Institute of Physics Electron Microscopy and Analysis Group Conference; Cherns, David; Institute of Physics; Institute …
3.
Electron microscopy and analysis, 1993 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Liverpool, &hellip by Institute of Physics Electron Microscopy and Analysis Group Conference; Craven, A. J.; Institute of Physics; Institute …
4.
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A. by Krakow, William; Ponce, Fernando A.; Smith, David J., 1948-; Symposium on High Resolution Microscopy of Materials; …
6.
Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991 by Cullis, A. G.; Long, N. J.; Institute of Physics; Royal Microscopical Society; Materials Research Society
8.
Electron microscopy of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A. by Symposium on Electron Microscopy of Materials; Krakow, William; Smith, David A.; Hobbs, Linn W.; Materials Research …
12.
Proceedings of the Sixth International Conference on X-ray optics and microanalysis by International Congress on X-ray Optics and Microanalysis; Shinoda, G.; 高良, 和武; 市ノ川, 竹男