Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991

フォーマット:
図書
責任表示:
edited by M.R. Brozel, D.J. Stirlnd
本文言語:
英語
説明:
310 p.: ill. (some col.); 31 cm
出版情報:
New York, United States. 1992. Adam Hilger
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